Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques

被引：17

作者：

Margheri, G ^{[1
]}

Giorgetti, E ^{[1
]}

Sottini, S ^{[1
]}

Toci, G ^{[1
]}

机构：

[1] CNR, Ist Fis Applicata Nello Carrara, I-50127 Florence, Italy

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2003年 / 20卷 / 04期

关键词：

D O I：

10.1364/JOSAB.20.000741

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The use of surface plasmon resonance as a powerful tool for the nonlinear characterization of ultrathin dielectric layers is investigated and experimentally demonstrated. The off-resonant intensity-dependent refractive index of 10-200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)2,4-hexadiyne deposited upon silver was measured at 1064 nm and with picosecond pulses. (C) 2003 Optical Society of America.

引用

页码：741 / 751

页数：11

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