Fiber-optic infrared measurement system for thermal measurement of a Kapton® HN sample

被引:0
|
作者
Rowley, MJ [1 ]
Rockwood, DN [1 ]
Miles, JJ [1 ]
机构
[1] James Madison Univ, Coll Integrated Sci & Technol, Infrared Dev & Thermal Testing Lab, Harrisonburg, VA 22807 USA
来源
THERMOSENSE XXV | 2003年 / 5073卷
关键词
infrared; non-contact temperature measurement; fiber-optic; Kapton (R);
D O I
10.1117/12.490003
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A dual-waveband, fiber-optic/infrared (F-O/IR) temperature measurement system was enhanced with incorporated optical chopping and applied to measure the surface temperature of a coated (aluminized) Kapton(R) HN sample. The F-O/IR system provides a non-contact means for accurate membrane temperature measurement without distorting surface contour. An FTIR spectrometer was used to measure the absorptance and reflectance properties of the Kapton(R) HN sample. A long-wave IR scanner was used to validate and enhance results obtained from the spectrometer and predict temperature dependence of optical properties. Data are presented that demonstrate the feasibility to apply the F-O/IR system for non-contact temperature measurement of highly reflective surfaces at low temperatures.
引用
收藏
页码:442 / 449
页数:8
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