Redefining cost of test in an SOC world

被引：0
|
作者：
Garcia, R [1 ]
机构：
[1] NPTest, San Jose, CA 95134 USA
来源：
EE-EVALUATION ENGINEERING | 2003年 / 42卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Optimizing COT for SOCs requires a new way of thinking.
引用
收藏
页码：30 / +
页数：5
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