Outage Probability Analysis for η-μ Fading Channels

被引：53
|
作者：
Morales-Jimenez, David [1 ]
Paris, Jose F. [1 ]
机构：
[1] Univ Malaga, Dept Ingn Comunicac, ETSI Telecomunicac, E-29071 Malaga, Spain
来源：
IEEE COMMUNICATIONS LETTERS | 2010年 / 14卷 / 06期
关键词：
eta-mu fading; Nakagami-q (Hoyt) fading; outage probability; maximal ratio combining;
D O I：
10.1109/LCOMM.2010.06.092501
中图分类号：
TN [电子技术、通信技术];
学科分类号：
0809 ;
摘要：
In this Letter we derive exact closed-form expressions for the outage probability (OP) in eta-mu fading channels. First, a general expression in terms of the confluent Lauricella function is derived for arbitrary values of mu. Next, we restrict the analysis to physical eta-mu channel models, i.e. to integer values of 2 mu, and obtain exact closed-form expressions for the OP in terms of Marcum Q, Bessel and elementary functions. The results in this Letter are applicable to the OP analysis of maximal ratio combining (MRC) over i.i.d. eta-mu or Hoyt fading channels.
引用
收藏
页码：521 / 523
页数：3
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