Secure Outage Probability Over κ-μ Fading Channels

被引:0
|
作者
Iwata, Shunya [1 ]
Ohtsuki, Tomoaki [1 ]
Kam, P. -Y. [2 ]
机构
[1] Keio Univ, Dept Comp & Informat Sci, Tokyo, Japan
[2] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore, Singapore
关键词
Physical layer security; secure outage probability; kappa-mu fading channel; Nakagami-m fading channel; Rician fading channel; probability of strictly positive secrecy capacity; PHYSICAL LAYER SECURITY;
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
In this paper, we derive the analytical expressions for the secure outage probability in a single-input single-output (SISO) system over fading, in which both the main and eavesdropper channels are subject to kappa-mu fading. Many authors have analyzed the secrecy performance of such a SISO system over various fading models. More recently, a lower bound on the secure outage probability over kappa-mu fading has been reported. However, the exact analytical expression of secure outage probability over kappa-mu fading has not been obtained. The problem with using the lower bound is that we are not sure about the tightness of the bound. Our result is an exact expression which is verified by Monte-Carlo simulations. Furthermore, it enables us to examine the behavior of the secure outage probability as a function of the fading parameters of both the main and eavesdropper channels for given values of the average signal-to-noise power ratio (SNR) over these channels. Exact expressions for the case of Nakagami-m and Rician fading models for both the main and eavesdropper channels are also obtained and verified by simulations.
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页数:6
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