Test program development in VLSI testing

This paper describes how an automatic test program generation environment is developed by making use of the Summit Design's TDS software modules as the basic building blocks, A new design-to-test process flow is defined, A solution of eliminating conversion errors of simulation post-processing is also proposed, In this approach, a functional test program can be generated within minutes, which dramatically shortens the test program development time and gets a new product faster to market.