Test program development in VLSI testing

被引：0
|
作者：
Wong, MWT
Cheung, KT
机构：
来源：
ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE | 1997年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
This paper describes how an automatic test program generation environment is developed by making use of the Summit Design's TDS software modules as the basic building blocks, A new design-to-test process flow is defined, A solution of eliminating conversion errors of simulation post-processing is also proposed, In this approach, a functional test program can be generated within minutes, which dramatically shortens the test program development time and gets a new product faster to market.
引用
收藏
页码：2697 / 2700
页数：4
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