Recent progress with high resolution X-ray microscopy at the XM-1

被引：1
|
作者：
Denbeaux, G
Schneider, G
Pearson, A
Chao, W
Bates, B
Harteneck, B
Olynick, D
Anderson, E
Fischer, P
Juenger, M
机构：
[1] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
[2] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[3] Univ Calif Berkeley, Dept Civil & Environm Engn, Berkeley, CA 94720 USA
来源：
JOURNAL DE PHYSIQUE IV | 2003年 / 104卷
关键词：
D O I：
10.1051/jp4:200300018
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：9 / 9
页数：1
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