Permittivity characterization from open-end microstrip line measurements

被引：8
|
作者：
Hinojosa, J. [1 ]
机构：
[1] Univ Politecn Cartagena, Dept Elect Tecnol Comp & Proyectos, Murcia 30202, Spain
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2007年 / 49卷 / 06期
关键词：
microstrip line; permittivity broad-band measurement; radiofrequency; and microwave; S-parameters;
D O I：
10.1002/mop.22410
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A broad-band method for measuring the complex permittivity of isotropic film-shaped materials at low microwave frequencies is presented. The characterized material is the substrate of art open-end microstrip line used as sample-cell. Complex permittivity is computed from S reflection parameter measurement of open-end microstrip cell using analytical relationships, which decrease the computation tune. Vector network analyzer and high-quality on-microstrip test fixture are used for the measurement bench. Measurements over 0.01 GHz-3 GHz frequency range with several nonmagnetic materials show good agreements between treasured and predicted results. (c) 2007 Wiley Periodicals, Inc.
引用
收藏
页码：1371 / 1374
页数：4
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