Permittivity characterization from open-end microstrip line measurements

被引：8

作者：

Hinojosa, J. ^{[1
]}

机构：

[1] Univ Politecn Cartagena, Dept Elect Tecnol Comp & Proyectos, Murcia 30202, Spain

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2007年 / 49卷 / 06期

关键词：

microstrip line; permittivity broad-band measurement; radiofrequency; and microwave; S-parameters;

D O I：

10.1002/mop.22410

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A broad-band method for measuring the complex permittivity of isotropic film-shaped materials at low microwave frequencies is presented. The characterized material is the substrate of art open-end microstrip line used as sample-cell. Complex permittivity is computed from S reflection parameter measurement of open-end microstrip cell using analytical relationships, which decrease the computation tune. Vector network analyzer and high-quality on-microstrip test fixture are used for the measurement bench. Measurements over 0.01 GHz-3 GHz frequency range with several nonmagnetic materials show good agreements between treasured and predicted results. (c) 2007 Wiley Periodicals, Inc.

引用

页码：1371 / 1374

页数：4

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