Polymer surface analysis by time-of-flight secondary ion mass spectrometry: Fact and fiction.

被引：0
|
作者：
Pachuta, SJ [1 ]
机构：
[1] 3M Co, Corp Res Labs, St Paul, MN 55144 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1998年 / 215卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
059-PMSE
引用
收藏
页码：U297 / U297
页数：1
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