Investigation of latex particle morphology and surface structure of the corresponding coatings by atomic force microscopy

被引：12
|
作者：
Gerharz, B [1 ]
Kuropka, R
Petri, H
Butt, HJ
机构：
[1] Hoechst AG, D-65926 Frankfurt, Germany
[2] Max Planck Inst Biophys, D-60596 Frankfurt, Germany
来源：
PROGRESS IN ORGANIC COATINGS | 1997年 / 32卷 / 1-4期
关键词：
surface topography; latex particle morphology; atomic force microscopy;
D O I：
10.1016/S0300-9440(97)00069-6
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
The surface topographies of different single latex particles, corresponding latex films and varnishes were investigated with an atomic force microscope. Three different latexes, consisting of homogeneous and composite particles were studied. The influence of wax and solvent on film formation and the dependence on the particle morphology was investigated. The atomic force microscope proofed to be an appropriate tool to reveal the surface structure of the films under ambient conditions. (C) 1997 Elsevier Science S.A.
引用
收藏
页码：75 / 80
页数：6
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