A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples

被引：7
|
作者：
Pearn, WL
Lin, GH
机构：
[1] Natl Chiao Tung Univ, Dept Ind Engn & Management, Hsinchu 30050, Taiwan
[2] Natl Penghu Inst Technol, Dept Commun Engn, White Sands Missile Range, NM 88002 USA
来源：
MICROELECTRONICS RELIABILITY | 2003年 / 43卷 / 04期
关键词：
D O I：
10.1016/S0026-2714(02)00323-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Process capability indices C-PU and C-PL are developed in the manufacturing industry to provide quantitative measures on process potential and performance. for processes with one-sided specification limits. Statistical properties of the estimators of C-PU and C-PL have been investigated extensively, but only restricted to cases with single samples. In this paper, we consider the estimation and capability testing of C-PU and C-PL based on multiple samples. We show that the proposed estimator of C-PU and C-PL are indeed the uniformly minimum variance unbiased estimators (UMVUEs). A simple procedure based on a hypothesis testing using the UMVUE is developed for the practitioners to use for judging whether a stable process meets the preset capability requirement. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：651 / 664
页数：14
相关论文
共 46 条
12345