Validation of Geant4 atomic relaxation against the NIST physical reference data

被引：27
|
作者：
Guatelli, S. [1 ]
Mantero, A. [1 ]
Mascialino, B. [1 ]
Pia, M. G. [1 ]
Zampichelli, V. [1 ]
机构：
[1] Ist Nazl Fis Nucl, Sezione Genova, I-16146 Genoa, Italy
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 03期
关键词：
Auger electron; fluorescence; Geant4; Monte Carlo; simulation;
D O I：
10.1109/TNS.2007.894814
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The accuracy of the Geant4 component for the simulation of atomic relaxation has been evaluated against the experimental measurements of the NIST Standard Reference Data. The validation study concerns X-ray and Auger transition energies. The comparison of the simulated and experimental data with rigorous statistical methods demonstrates the excellent accuracy of the simulation of atomic de-excitation in Geant4.
引用
收藏
页码：594 / 603
页数：10
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