Ion mass dependence of normalized regrowth rate in MeV ion beam induced epitaxial crystallization (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 277-280, 1995)

被引:0
|
作者
Kinomura, A [1 ]
Chayahara, A [1 ]
Horino, Y [1 ]
Mokuno, Y [1 ]
Fujii, K [1 ]
机构
[1] AIST,OSAKA NATL RES INST,IKEDA,OSAKA 563,JAPAN
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:277 / 280
页数:4
相关论文
共 50 条
  • [1] Ion mass dependence of normalized regrowth rate in MeV ion beam induced epitaxial crystallization
    Kinomura, A
    Chayahara, A
    Horino, Y
    Mokuno, Y
    Fujii, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 106 (1-4): : 277 - 280
  • [2] Ion mass dependence of normalized regrowth rate in MeV ion beam induced epitaxial crystallization
    Kinomura, A.
    Chayahara, A.
    Horino, Y.
    Mokuno, Y.
    Fujii, K.
    Nuclear Instruments & Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1995, 106 (1-4):
  • [3] Ion beam induced epitaxial regrowth and layer by layer amorphization of compound semiconductors during MeV ion implantation (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 281-288, 1995)
    Glaser, E
    Bachmann, T
    Schulz, R
    Schippel, S
    Richter, U
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 281 - 288
  • [4] Ion beam induced epitaxial crystallization and interfacial amorphization at amorphous/crystalline interfaces in germanium (reprinted from Nuclear Instruments and methods in Physics Research, vol 106, pg 350-354, 1995)
    Bachmann, T
    Schulz, R
    Glaser, E
    Richter, U
    Schippel, S
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 350 - 354
  • [5] Ion beam induced epitaxial recrystallization of alumina thin films deposited on sapphire (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 579-582, 1995)
    Yu, N
    Nastasi, M
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 579 - 582
  • [6] Ion beam-induced interfacial growth in Si and silicides (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 206-215, 1995)
    Fortuna, F
    Nedellec, P
    Ruault, MO
    Bernas, H
    Lin, XW
    Boucaud, P
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 206 - 215
  • [7] The temperature dependence of ion-beam-induced amorphization in beta-SiC (reprinted from Nuclear Instruments and Methods in Physics Research, vol 106, pg 298-302, 1995)
    Weber, WJ
    Wang, LM
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 298 - 302
  • [8] Novel beam effect: Mass transport due to the lateral component of the ion momentum (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 80-83, 1995)
    Roorda, S
    Cliche, L
    Chicoine, M
    Masut, RA
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 80 - 83
  • [9] Systematic study of the ion beam mixing of oxide markers into alumina (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 9-16, 1995)
    Cooper, EA
    Kung, H
    Nastasi, M
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 9 - 16
  • [10] Local material removal by focused ion beam milling and etching (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 630-635, 1995)
    Lipp, S
    Frey, L
    Franz, G
    Demm, E
    Petersen, S
    Ryssel, H
    ION BEAM MODIFICATION OF MATERIALS, 1996, : 630 - 635