Measurement of Rapid Temperature Profiles Using Thermoluminescent Microparticles

被引：23
|
作者：
Mah, Merlin L. [1 ]
Manfred, Michael E.
Kim, Sangho S. [1 ]
Prokic, Mirjana [2 ]
Yukihara, Eduardo G. [3 ]
Talghader, Joseph J. [1 ]
机构：
[1] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
[2] Inst Nucl Sci, Belgrade 11000, Serbia
[3] Oklahoma State Univ, Dept Phys, Stillwater, OK 74078 USA
来源：
IEEE SENSORS JOURNAL | 2010年 / 10卷 / 02期
关键词：
Microelectromechanical devices; temperature measurement; thermal history; thermoluminescence (TL);
D O I：
10.1109/JSEN.2009.2034023
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The thermal history of a material with initially filled trap states may be probed using thermoluminescence. Since luminescent microparticles are composed of robust oxides, they are viable candidates for sensing temperature under conditions where all other types of direct-contact sensors fail. Mg(2)SiO(4) : Tb, Co particles with two thermoluminescent peaks have been heated using micromachined heaters over a 232 degrees C to 313 degrees C range on time scales of less than 200 ms. The effect of maximum temperature during excitation on the intensity ratio of the two luminescent peaks has been compared with first-order kinetics theory and shown to match within an average error of 4.4%.
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页码：311 / 315
页数：5
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