Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images

被引：6

作者：

Nomaguchi, T ^{[1
]}

Kawasaki, T ^{[1
]}

Kimura, Y ^{[1
]}

Takai, Y ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan

来源：

JOURNAL OF ELECTRON MICROSCOPY | 2004年 / 53卷 / 04期

关键词：

high-resolution transmission electron microscopy; through-focus series of images; linear imaging component; non-linear imaging component; three-dimensional Fourier filtering method;

D O I：

10.1093/jmicro/dfh068

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Linear and non-linear image components in high-resolution transmission electron microscope images were successfully separated by applying a bandpass filter to the three-dimensional Fourier spectrum of its through-focus series of images. In the observed lattice image of a wedgeshaped Si [110] crystal, we determined the magnitude of the contribution of the non-linear imaging components to the total image intensity distribution. The contribution was proved to become sometimes larger than that of the linear imaging component, even at a thickness of 13 nm.

引用

页码：403 / 406

页数：4

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