Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images

被引：6
|
作者：
Nomaguchi, T [1 ]
Kawasaki, T [1 ]
Kimura, Y [1 ]
Takai, Y [1 ]
机构：
[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan
来源：
JOURNAL OF ELECTRON MICROSCOPY | 2004年 / 53卷 / 04期
关键词：
high-resolution transmission electron microscopy; through-focus series of images; linear imaging component; non-linear imaging component; three-dimensional Fourier filtering method;
D O I：
10.1093/jmicro/dfh068
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Linear and non-linear image components in high-resolution transmission electron microscope images were successfully separated by applying a bandpass filter to the three-dimensional Fourier spectrum of its through-focus series of images. In the observed lattice image of a wedgeshaped Si [110] crystal, we determined the magnitude of the contribution of the non-linear imaging components to the total image intensity distribution. The contribution was proved to become sometimes larger than that of the linear imaging component, even at a thickness of 13 nm.
引用
收藏
页码：403 / 406
页数：4
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