共 50 条
- [22] Fourier plane filters and common-path interferometry in vibrometers and electronic speckle interferometers OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001), 2001, 4416 : 108 - 111
- [23] Clearance Measurement of Commercial Slider/Disk with a Symmetrical Common-path Heterodyne Interferometry 6TH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION, 2010, 7544
- [30] Roughness Characterization of ultra-smooth surfaces using common-path interferometry SURFACE CHARACTERIZATION FOR COMPUTER DISKS, WAFERS, AND FLAT PANEL DISPLAYS, 1999, 3619 : 121 - 127