Planar Thick Film Inductor Characterization

被引：0
|
作者：
Pulec, Jiri [1 ]
Szendiuch, Ivan [1 ]
机构：
[1] Brno Univ Technol, Fac Elect Engn & Commun, Tech 10, Brno 61600, Czech Republic
来源：
EMPC-2011: 18TH EUROPEAN MICROELECTRONICS & PACKAGING CONFERENCE | 2011年
关键词：
Planar inductor; Inductance; Magnetic field; Numerical modeling;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper describes experiment where model of thick film inductor was created, simulated and verified. For simulation, the FEM (Finite Element Method) was used. In this paper are shown graphical outputs of simulation. Next part of this work was experimental verifying of obtained results. For this, testing sample was designed, manufactured and measured. Measured values were statistically evaluated.
引用
收藏
页数：4
相关论文
共 50 条
  • [31] RF characterization of thick film materials for portable transceivers
    Harrer, J
    Petit, R
    Brown, O
    Nabatian, D
    Shahbazi, S
    1996 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, 1996, 2920 : 462 - 469
  • [32] Fabrication and Characterization of Thick Film Piezoelectric Ultrasonic Transducers
    Kobayashi, M.
    Jen, C. -K.
    2006 IEEE ULTRASONICS SYMPOSIUM, VOLS 1-5, PROCEEDINGS, 2006, : 816 - 819
  • [33] Characterization of Thick Film Pastes for Aluminum Nitride Substrates
    Hlina, Jiri
    Reboun, Jan
    Hamacek, Ales
    2021 44TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE), 2021,
  • [34] Characterization of a thick film microwave device (part I)
    Nabatian, DJ
    Kellerman, D
    Dixon, J
    2000 HD INTERNATIONAL CONFERENCE ON HIGH-DENSITY INTERCONNECT AND SYSTEMS PACKAGING, 2000, 4217 : 378 - 383
  • [35] METHOD FOR THE RHEOLOGICAL CHARACTERIZATION OF THICK-FILM PASTES
    KARDASHIAN, VS
    VELLANKI, SJR
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1979, 2 (02): : 232 - 239
  • [36] Characterization of Thick Film of Copper Electrodeposited for Cryogenic Applications
    Fava, A.
    Lucci, M.
    Faso, D.
    Luzzi, A.
    Salvato, M.
    Vecchione, A.
    Fittipaldi, R.
    Ottaviani, I.
    Colantoni, I.
    Tomellini, M.
    Davoli, I.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2014, 161 (10) : D540 - D545
  • [37] Characterization of composite piezoelectric thick film for MEMS application
    Wang, ZH
    Zhu, WG
    Chao, C
    Zhao, CL
    Chen, XF
    SURFACE & COATINGS TECHNOLOGY, 2005, 198 (1-3): : 384 - 388
  • [38] Characterization of a nanometer-thick sputtered polytetrafluoroethylene film
    Li, Lei
    Jones, Paul M.
    Hsia, Yiao-Tee
    APPLIED SURFACE SCIENCE, 2011, 257 (09) : 4478 - 4485
  • [39] CHARACTERIZATION OF THICK FILM RESISTIVES FOR MAXIMUM PRODUCTION YIELDS
    DRYDEN, WG
    OST, RJ
    WOLF, RB
    PROCEEDINGS ELECTRONIC COMPONENTS CONFERENCE, 1970, : 412 - &
  • [40] MATERIAL CHARACTERIZATION OF THICK FILM-RESISTOR PASTES
    SHAH, JS
    HAHN, WC
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1978, 1 (04): : 383 - 392
12345