DSC and X-ray measurements as methods to detect lattice distortions

被引:5
|
作者
Sigrist, K
机构
[1] Leipziger Str. 40
关键词
DSC; lattice distortions; metals; x-ray study;
D O I
10.1016/S0040-6031(97)00473-5
中图分类号
O414.1 [热力学];
学科分类号
摘要
The homogeneous lattice distortions in the crystals of several cubic, tetragonal and hexagonal metals, estimated from literature data, can be principally detected by DSC measurements and X-ray studies. Therefore, using these methods, it should be possible to effortlessly modify a theory of inhomogeneous and homogeneous lattice distortions, which has existed for ca. 10 years, by further planned experimental examinations. (C) 1998 Elsevier Science B.V.
引用
下载
收藏
页码:213 / 216
页数:4
相关论文
共 50 条
  • [21] X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation
    Hofmann, Felix
    Abbey, Brian
    Liu, Wenjun
    Xu, Ruqing
    Usher, Brian F.
    Balaur, Eugeniu
    Liu, Yuzi
    NATURE COMMUNICATIONS, 2013, 4
  • [22] X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation
    Felix Hofmann
    Brian Abbey
    Wenjun Liu
    Ruqing Xu
    Brian F. Usher
    Eugeniu Balaur
    Yuzi Liu
    Nature Communications, 4
  • [23] X-ray spectral reconstruction methods based on transmission measurements
    Lin, Guifen
    Luo, Limin
    Shuju Caiji Yu Chuli/Journal of Data Acquisition and Processing, 2008, 23 (01): : 75 - 79
  • [24] USE OF X-RAY TOPOGRAPHIC METHODS FOR STUDY OF LATTICE-DEFECTS
    PETROFF, JF
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1978, 33 (190): : 9 - 14
  • [25] X-RAY METHODS
    PERRY, BJ
    PHYSICS IN MEDICINE AND BIOLOGY, 1976, 21 (06): : 1003 - 1003
  • [26] Quantitative determination of bond order and lattice distortions in nickel oxide heterostructures by resonant x-ray scattering
    Lu, Y.
    Frano, A.
    Bluschke, M.
    Hepting, M.
    Macke, S.
    Strempfer, J.
    Wochner, P.
    Cristiani, G.
    Logvenov, G.
    Habermeier, H. -U.
    Haverkort, M. W.
    Keimer, B.
    Benckiser, E.
    PHYSICAL REVIEW B, 2016, 93 (16)
  • [27] X-ray diffraction measurements on lattice mismatch of InTlAs grown on InAs substrates
    Kajikawa, Y
    Asahina, S
    Kanayama, N
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (01): : 28 - 33
  • [28] Lattice strain in oxidized Si nanostructure arrays from X-ray measurements
    Tanaka, S
    Umbach, CC
    Shen, Q
    Blakely, JM
    THIN SOLID FILMS, 1999, 343 : 365 - 369
  • [30] A HIGH TEMPERATURE ATTACHMENT FOR AN X-RAY DIFFRACTOMETER FOR PRECISION LATTICE PARAMETER MEASUREMENTS
    CORNISH, AJ
    BURKE, J
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (04): : 212 - &