Medium noise in longitudinal thin film disk media above 20 Gb/in2

被引:0
|
作者
Wei, D [1 ]
Ong, CK
机构
[1] Tsinghua Univ, Dept Mat Sci & Engn, Adv Mat Lab, Beijing 100084, Peoples R China
[2] Natl Univ Singapore, Ctr Superconducting & Magnet Mat, Singapore 119260, Singapore
[3] Natl Univ Singapore, Dept Phys, Singapore 119260, Singapore
来源
IEICE TRANSACTIONS ON ELECTRONICS | 2000年 / E83C卷 / 09期
关键词
thin film; medium noise; simulation; longitudinal disk media;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Medium noise is the dominant noise in ultrahigh density disk recording systems. The peak, width and jitter noise are analyzed by micromagnetic simulations. Four different media, with a fixed grain size of 135 Angstrom and a coercivity of 2900 Oe, are chosen for medium noise analysis. The linear recording density is increased from 340 KFCI (Kilo flux-changes per inch) to 750 KFCI, while the area density goes up from 14.3 Gb/in(2) to 31.5 Gb/in(2). The peak-amplitude noise is studied by the distribution of the peak magnetization M-p in each bit. The distribution of M-p develops from a delta-function around the remanence M-r at low densities to a flat distribution at extremely high densities. It is found that the transition a-parameter is no longer proportional to the square root of M(r)delta, as given in the William-Comstock approximation. The peak-jitter noise in the read back voltage is analyzed by the percentage of the transition jitter in a bit length.
引用
收藏
页码:1494 / 1499
页数:6
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