STM Imaging of Electron Migration in Real Space and Time: A Simulation Study

被引：17
|
作者：
Kwok, YanHo [1 ,2 ]
Chen, GuanHua [1 ]
Mukamel, Shaul [3 ]
机构：
[1] Univ Hong Kong, Dept Chem, Pofkulam Rd, Hong Kong, Peoples R China
[2] QuantumFabless Ltd, Sha Tin, Hong Kong, Peoples R China
[3] Univ Calif Irvine, Dept Chem & Phys & Astron, Irvine, CA 92617 USA
来源：
NANO LETTERS | 2019年 / 19卷 / 10期
基金：
美国国家科学基金会;
关键词：
Scanning tunneling microscopy; optical pump-probe; charge migration; time-dependent simulation; DYNAMICS; CHARGE; SPECTROSCOPY;
D O I：
10.1021/acs.nanolett.9b02389
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Using a simulation protocol that mimics ultrafast scanning tunneling microscopy (STM) experiments, we demonstrate how pump-probe ultrafast STM may be used to image electron migration in molecules. Two pulses are applied to a model system, and the time-integrated current through the tip is calculated versus the delay time and tip position to generate STM images. With suitable pump and probe parameters, the images can track charge migration with atomistic spatial and femtosecond temporal resolutions.
引用
收藏
页码：7006 / 7012
页数：7
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