A review of electron scattering cross section measurements by use of pulsed electron beam time of flight techniques

被引：3
|
作者：
Bonham, R. A. [1 ]
机构：
[1] IIT, Dept Biol Chem & Phys Sci, Chicago, IL 60616 USA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2007年 / 155卷 / 1-3期
关键词：
electron scattering; photon scattering; cross sections; pulsed electron beams; time of flight;
D O I：
10.1016/j.elspec.2006.11.003
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
A review of the relative sizes of cross sections for photon and electron scattering by atoms and molecules is presented. Advantages and drawbacks associated with the use of each probe is discussed. Experiments carried out by the author and his collaborators using pulsed electron beams with time of flight analysis are reviewed. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：1 / 6
页数：6
相关论文
共 50 条
  • [41] Plasma electron source with a beam of large cross section
    Gruzdev, V.A.
    Zalesski, V.G.
    Antonovich, D.A.
    Golubev, Yu.P.
    Inzhenerno-Fizicheskii Zhurnal, 2002, 75 (03): : 166 - 170
  • [42] MEASUREMENTS ON ELECTRON-CAPTURE CROSS-SECTION
    MOTHES, KG
    SCHINDLE.RN
    SCHULTES, E
    CHEMIE INGENIEUR TECHNIK, 1972, 44 (06) : 439 - &
  • [43] Modeling and Measurements of Electron Beam Scattering into Adjacent Particles
    Wight, S. A.
    Small, J. A.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 1266 - 1267
  • [44] Electron beam welding - Techniques and trends - Review
    St Weglowski, M. S.
    Blacha, S.
    Phillips, A.
    VACUUM, 2016, 130 : 72 - 92
  • [45] CROSS-SECTIONS FOR DIRECT ELECTRON-EXCITATION OF ATOMIC LEVELS - MEASUREMENTS USING PULSED ELECTRON-BEAM AND TIME SCANNING OF RADIATION .4.
    BOGDANOVA, IP
    YURGENSON, SV
    OPTIKA I SPEKTROSKOPIYA, 1987, 63 (06): : 1373 - 1375
  • [46] Water vapor electron scattering cross-section measurements using a hydrophobic ionic liquid
    Khalifa, Yehia
    Broderick, Alicia
    Newberg, John T.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2018, 222 : 162 - 166
  • [47] RELATIVE CROSS SECTION MEASUREMENTS FOR ELECTRON SCATTERING BY ATOMIC NITROGEN (0.2-3 EV)
    MILLER, TM
    AUBREY, BB
    EISNER, PN
    BEDERSON, B
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1970, 15 (03): : 416 - &
  • [48] MICROWAVE POWER MEASUREMENTS EMPLOYING ELECTRON BEAM TECHNIQUES
    THOMAS, HA
    PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (02): : 205 - 211
  • [49] MICROWAVE POWER MEASUREMENTS EMPLOYING ELECTRON BEAM TECHNIQUES
    HOSKIN, WJ
    PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (09): : 1285 - 1285
  • [50] Electron time-of-flight measurements in porous silicon
    Rao, P
    Schiff, EA
    Tsybeskov, L
    Fauchet, PM
    ADVANCES IN MICROCRYSTALLINE AND NANOCRYSTALLINE SEMICONDUCTORS - 1996, 1997, 452 : 613 - 618
12345