Dynamic power-supply and well noise measurement and analysis for high frequency body-biased circuits

被引：18

作者：

Shimazaki, K ^{[1
]}

Nagata, M ^{[1
]}

Okumoto, T ^{[1
]}

Hirano, S ^{[1
]}

Tsujikawa, H ^{[1
]}

机构：

[1] Matsushita Elect Ind Co Ltd, Kyoto 6178520, Japan

来源：

2004 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS | 2004年

关键词：

D O I：

10.1109/VLSIC.2004.1346516

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Dynamic noises on power-supply as well as multiple wells necessary for body-biased circuits show frequency components strongly characterized by the interaction of circuit operation and AC transfer of biasing networks. Measurements with the resolution of 100-ps and 100-uV for a few 100-ns and 1-V ranges on multiple points in a product register file are performed at various operating frequencies up to 400 MHz and show the noises clearly emphasized in frequency domain by the interaction. A proposed analysis flow recruiting a fast SPICE simulator and parasitic extractors can predict the dynamic noises due to combined power supply, ground, well, and substrate interactions, and provide robustness to the design of body-bias control circuitry.

引用

页码：94 / 97

页数：4

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