Dynamic power-supply and well noise measurement and analysis for high frequency body-biased circuits

被引:18
|
作者
Shimazaki, K [1 ]
Nagata, M [1 ]
Okumoto, T [1 ]
Hirano, S [1 ]
Tsujikawa, H [1 ]
机构
[1] Matsushita Elect Ind Co Ltd, Kyoto 6178520, Japan
来源
2004 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS | 2004年
关键词
D O I
10.1109/VLSIC.2004.1346516
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Dynamic noises on power-supply as well as multiple wells necessary for body-biased circuits show frequency components strongly characterized by the interaction of circuit operation and AC transfer of biasing networks. Measurements with the resolution of 100-ps and 100-uV for a few 100-ns and 1-V ranges on multiple points in a product register file are performed at various operating frequencies up to 400 MHz and show the noises clearly emphasized in frequency domain by the interaction. A proposed analysis flow recruiting a fast SPICE simulator and parasitic extractors can predict the dynamic noises due to combined power supply, ground, well, and substrate interactions, and provide robustness to the design of body-bias control circuitry.
引用
收藏
页码:94 / 97
页数:4
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