Uncertainties in Charge Measurements of ESD Risk Assessment

被引：0

作者：

Viheriakoski, Toni ^{[1
]}

Kohtamaki, Jari ^{[2
]}

Peltoniemi, Terttu ^{[3
]}

Tamminen, Pasi ^{[4
]}

机构：

[1] Cascade Metrol, Hakulintie 32, Lohja 08500, Finland

[2] ABB Oy, Medium Voltage Prod, Vaasa, Finland

[3] Nokia, FI-90620 Oulu, Finland

[4] Microsoft, FI-33720 Tampere, Finland

来源：

2015 37TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2015年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Charge measurement techniques are often considered too complicate to the process control of electronics manufacturing. In his study, we show that expensive instrumentation is not necessarily needed for characterizing ESD source parameters in a risk assessment. Measurement can be made accurately when uncertainties are properly taken into account.

引用

页数：8

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