Improving fault coverage in system tests

被引：0
|
作者：
Sosnowski, J [1 ]
机构：
[1] Warsaw Univ Technol, Inst Comp Sci, PL-00665 Warsaw, Poland
来源：
6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/OLT.2000.856638
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
The paper is devoted to the problem of self-testing in system environment (field diagnosis and maintenance at the end user). It discusses lest process decomposition ill thf context of increasing hardware complexity and proliferation of embedded DFT and BIST circuitry in the commercial off-the shelve VLSI chips (COTS). Test observability is improved with the use of various on-line I,monitoring mechanisms. TO optimize test effectiveness we use special tools based on direct and indirect fault coverage analysis.
引用
收藏
页码：207 / 213
页数：7
相关论文
共 50 条
  • [31] On the Relationship between Stuck-At Fault Coverage and Transition fault Coverage
    Schat, Jan
    DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3, 2009, : 1218 - 1221
  • [32] A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits
    Sanyal, Sayandeep
    Bhattacharya, Mayukh
    Patra, Amit
    Dasgupta, Pallab
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020, 36 (06): : 719 - 730
  • [33] Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit
    Liu, Zhiqiang
    Chaganti, Shravan K.
    Chen, Degang
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2018, 65 (05) : 1664 - 1674
  • [34] A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits
    Sayandeep Sanyal
    Mayukh Bhattacharya
    Amit Patra
    Pallab Dasgupta
    Journal of Electronic Testing, 2020, 36 : 719 - 730
  • [35] Improving transition delay fault coverage using hybrid scan-based technique
    Ahmed, N
    Tehranipoor, M
    DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, 2005, : 187 - 195
  • [36] Distributed Antenna System for Improving THz Coverage Inside Rooms
    Prokscha, Andreas
    Sheikh, Fawad
    Zarifeh, Nidal
    Mabrouk, Ismail
    Kaiser, Thomas
    2021 IEEE-APS TOPICAL CONFERENCE ON ANTENNAS AND PROPAGATION IN WIRELESS COMMUNICATIONS (APWC), 2021, : 112 - 112
  • [37] Improving system reliability with automatic fault tree generation
    Liggesmeyer, P
    Rothfelder, M
    TWENTY-EIGHTH ANNUAL INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST PAPERS, 1998, : 90 - 99
  • [38] Quantitative method of dynamic fault tree analysis for imperfect coverage system
    Li P.
    Yuan H.
    Cao Z.
    Zhang H.
    Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics, 2016, 42 (09): : 1986 - 1991
  • [39] Parallel fault backtracing for calculation of fault coverage
    Ubar, Raimund
    Devadze, Sergei
    Raik, Jaan
    Jutman, Artur
    2008 ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2008, : 633 - 638
  • [40] Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits
    Lingappan, Loganathan
    Gangaram, Vijay
    Jha, Niraj K.
    Chakravarty, Sreejit
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2009, 17 (05) : 697 - 708
12345