Improving fault coverage in system tests

被引：0
|
作者：
Sosnowski, J [1 ]
机构：
[1] Warsaw Univ Technol, Inst Comp Sci, PL-00665 Warsaw, Poland
来源：
6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/OLT.2000.856638
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
The paper is devoted to the problem of self-testing in system environment (field diagnosis and maintenance at the end user). It discusses lest process decomposition ill thf context of increasing hardware complexity and proliferation of embedded DFT and BIST circuitry in the commercial off-the shelve VLSI chips (COTS). Test observability is improved with the use of various on-line I,monitoring mechanisms. TO optimize test effectiveness we use special tools based on direct and indirect fault coverage analysis.
引用
收藏
页码：207 / 213
页数：7
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