Wire bondability of Au/Ni bond pads: Effects of metallisation schemes and processing conditions

被引:0
|
作者
Chan, YH [1 ]
Kim, JK [1 ]
Liu, DM [1 ]
Liu, PCK [1 ]
Cheung, YM [1 ]
Ng, MW [1 ]
机构
[1] Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China
来源
PROCEEDINGS OF THE 4TH INTERNATIONAL SYMPOSIUM ON ELECTRONIC MATERIALS AND PACKAGING | 2002年
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The wire bondability and surface characteristics were studied of Au/Ni bond pads on organic FR-4 PCBs with different gold plating schemes and gold thickness. Three different plating techniques were used to deposit gold layers, namely the electrolytic gold plating, immersion gold plating and immersion gold plating followed by electrolytic gold plating. Process windows for the individual metallisation schemes were established to optimize the wire bond force and bond power. Bond performance after wire bonding was evaluated based on, the wire pull strength and wire deformation ratio. Various elemental and surface characterization techniques, such as SEM, Optical profiler, XPS, nano-hardness test and surface energy analysis, were employed to characterize the bond pad surfaces, which were then correlated to the wire bond performance. The effects of plasma treatment using Ar and O-2 gases were also studied.
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页码:69 / 76
页数:8
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