Near field optical microscopy and spectroscopy with STM and AFM probes

被引：1

作者：

Bergossi, O ^{[1
]}

Bachelot, R ^{[1
]}

Wioland, H ^{[1
]}

Wurtz, G ^{[1
]}

Laddada, R ^{[1
]}

Adam, PM ^{[1
]}

Bijeon, JL ^{[1
]}

Royer, P ^{[1
]}

机构：

[1] Univ Technol Troyes, Lab Nanotech & Instrumentat Opt, F-10010 Troyes, France

来源：

ACTA PHYSICA POLONICA A | 1998年 / 93卷 / 02期

关键词：

D O I：

10.12693/APhysPolA.93.393

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

This article deals with a new generation of scanning near field optical microscopes (SNOM), called apertureless SNOM, based on metallic, semi-conductive or dielectric probes. The classification of the apertureless probe among the usual SNOM probes is discussed in the first part. Then, we present the different apertureless SNOM configurations that we develop, with various commercial AFM and home-made tungsten tips, and several illumination and collection modes. Finally, after a preliminary result in near field imaging, we propose a promising application of such microscopes dedicated to the near field fluorescence spectroscopy.

引用

页码：393 / 398

页数：6

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