X-ray tomography using a CMOS area detector

被引：1

作者：

Brunetti, A.

Cesareo, R.

机构：

[1] Univ Sassari, Dept Math & Phys, I-07100 Sassari, Italy

[2] Ist Nazl Fis Nucl, Sez Cagliari, Cagliari, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2007年 / 258卷 / 02期

关键词：

flat panel; imaging; tomography;

D O I：

10.1016/j.nimb.2007.02.067

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A flat panel based on CMOS technology represents a valid alternative to other kinds of flat panels and to ccd detectors for X-ray imaging. Although the spatial resolution of the ccd sensors is better than that of a CMOS sensor, the last has a larger sensitive-area and it can work at room temperature reaching a dynamic performance comparable to that of a cooled ccd sensor. Other kinds of flat panels, such as TFT screen are much more expensive and they have lower spatial resolution and higher noise than the CMOS detector. In this paper, an application of the CMOS sensor to X-ray tomography is described. Preliminary results are reported and discussed. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：485 / 489

页数：5

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