共 50 条
- [41] Three-dimensional simulation of top down scanning electron microscopy images JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (06): : 3399 - 3404
- [44] Three-Dimensional Orientation Microscopy in a Focused Ion Beam–Scanning Electron Microscope: A New Dimension of Microstructure Characterization Metallurgical and Materials Transactions A, 2008, 39 : 374 - 389
- [50] Three-Dimensional Reconstruction of Planar Deformation Features from Single Electron Micrographs Metallurgical and Materials Transactions A, 2020, 51 : 1163 - 1172