Structural Software-Based Self-Test of Network-on-Chip

被引：0
|
作者：
Dalirsani, Atefe [1 ]
Imhof, Michael E. [1 ]
Wunderlich, Hans-Joachim [1 ]
机构：
[1] Univ Stuttgart, Inst Comp Architecture & Comp Engn, Stuttgart, Germany
来源：
2014 IEEE 32ND VLSI TEST SYMPOSIUM (VTS) | 2014年
关键词：
Network-on-Chip (NoC); Software-Based Self-Test (SBST); Automatic Test Pattern Generation (ATPG); Boolean Satisfiability (SAT); DIAGNOSIS;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Software-Based Self-Test (SBST) is extended to the switches of complex Network-on-Chips (NoC). Test patterns for structural faults are turned into valid packets by using satisfiability (SAT) solvers. The test technique provides a high fault coverage for both manufacturing test and online test.
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页数：6
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