X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a-plane sapphire by metalorganic vapour phase epitaxy

被引：0

作者：

Martinez-Tomas, M. C.

Zuniga-Perez, J.

Vennegues, P.

Tottereau, O.

Munoz-Sanjose, V.

机构：

[1] Dept Fis Aplicada & Electromagnetisme, Valencia 46100, Spain

[2] CNRS, Ctr Rech Heteroepitaxie & Ses Applicat, F-06560 Valbonne, France

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2007年 / 88卷 / 01期

关键词：

D O I：

10.1007/s00339-007-3977-x

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the frame of studying II-VI oxides of interest in optoelectronic technologies, the structural properties of CdO films grown by metalorganic vapour phase epitaxy on a-plane sapphire substrates have been analysed. The study has been performed by means of X-ray diffraction and cross-sectional transmission electron microscopy measurements. CdO films have been found to grow along [111] with the presence of twinned domains. Asymmetrical reflections have been used to study the crystalline quality of the twinned domains, independent of each other, as well as to determine their relative population. The analysis has been made as a function of growth conditions: VI/II precursors molar ratio and growth temperature.

引用

页码：61 / 64

页数：4

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