Mapping high-pressure Bridgman Cd0.8Zn0.2Te

Single crystals of Cd0.8Zn0.2Te grown at the institute of Solid State Physics, Chernogolovka, Russia, by the high-pressure vertical Bridgman method (HPVB) were mapped using X-ray fluorescence (XRF), X-ray diffraction (XRD), photoluminescence (PL), and leakage current measurements, Most of the Russian samples which we refer to as p-type CZT were more uniform in Zn composition than U.S. commercially produced material. The Russian material had a poorer crystallinity and, in the best case, could only count nuclear radiation, Differences in the material properties between Russian (p-type) and U.S. (n-type) material will be described.