Growth and properties of high resistivity Cd0.8Zn0.2Te single crystals

被引：0
|
作者：
Li, Qifeng [1 ]
Zhu, Shifu [1 ]
Zhao, Beijun [1 ]
Cai, Li [1 ]
Gao, Deyou [1 ]
Jin, Yingrong [1 ]
机构：
[1] Dept. of Mat. Sci., Sichuan Univ., Chengdu 610064, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 2002年 / 23卷 / 02期
关键词：
Bridgeman method - CZT crystal - Room nuclear radiation detector;
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学科分类号：
摘要：
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页码：157 / 160
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