共 50 条
- [1] ELATE: Embedded Low Cost Automatic Test Equipment for FPGA Based Testing of Digital Circuits [J]. 2017 10TH INTERNATIONAL CONFERENCE ON ELECTRICAL AND ELECTRONICS ENGINEERING (ELECO), 2017, : 1281 - 1285
- [2] VECTOR ERROR TESTING BY AUTOMATIC TEST EQUIPMENT [J]. HEWLETT-PACKARD JOURNAL, 1994, 45 (05): : 64 - 66
- [3] Automatic equipment for testing of complex multiparametric intelligent devices [J]. 2017 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON) PROCEEDINGS, 2017,
- [4] FPGA Based Low Cost Automatic Test Equipment for Digital Circuits [J]. ELECTRICA, 2019, 19 (01): : 12 - 21
- [5] IMPLEMENTATION OF AN INTEGRATED FPGA BASED AUTOMATIC TEST EQUIPMENT AND TEST GENERATION FOR DIGITAL CIRCUITS [J]. 2013 INTERNATIONAL CONFERENCE ON INFORMATION COMMUNICATION AND EMBEDDED SYSTEMS (ICICES), 2013, : 741 - 746