Testing FPGA Devices on an Automatic Test Equipment

被引:0
|
作者
Xie Weikun [1 ]
Zhang Huibin [1 ]
Zhang Qiuli [2 ]
机构
[1] China Elect Technol Grp Corp, Res Inst 58, Test Ctr, Wuxi 214035, Peoples R China
[2] China Elect Technol Grp Corp, Res Inst 58, Wuxi 214035, Peoples R China
关键词
FPGA; Configuration; ATE; Test;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
With the rapid development of IC technology, the application of FPGA becomes more and more widely, more than 90% embedded system design engineers of the world are using the FPGA for a wide variety of designs. The rapid development of FPGA brings new opportunities and challenges for test manufacturers, a variety of innovative testing technologies and solutions for FPGA have been developed. This paper gives a brief introduction to the FPGA test approach on an Automatic Test Equipment(ATE), describes the method of FPGA configuration mode selection and FPGA configuration code generation, gives a detailed description of the FPGA configuration and testing process with a Virtex-6 FPGA-XC6VLX240T. At last, this paper discusses the DC and Function test methods.
引用
收藏
页码:65 / 70
页数:6
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