AUTOMATIC TEST EQUIPMENT

被引：0

作者：

BRIGHTY, P

机构：

来源：

ELECTRONIC ENGINEERING | 1974年 / 46卷 / 552期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：53 / &

共 50 条

[1] AUTOMATIC TEST EQUIPMENT
VERNON, N
[J]. ELECTRONICS AND POWER, 1977, 23 (01): : 44 - 48
[2] AUTOMATIC TEST EQUIPMENT
WALKER, ME
[J]. INSTRUMENT PRACTICE, 1968, 22 (12): : 1016 - &
[3] AUTOMATIC TEST EQUIPMENT - THE EQUIPMENT IS GETTING SMARTER
不详
[J]. ONDE ELECTRIQUE, 1980, 60 (04): : 57 - 59
[4] ACCURACY IN AUTOMATIC TEST EQUIPMENT
KIDD, MC
[J]. IEEE TRANSACTIONS ON AEROSPACE, 1964, AS 2 (03): : 1073 - &
[5] TRANSLATORS FOR AUTOMATIC TEST EQUIPMENT
STOLOV, SE
[J]. IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1976, 12 (02) : 308 - 308
[6] A DESIGNERS VIEW OF AUTOMATIC TEST EQUIPMENT
不详
[J]. VLSI SYSTEMS DESIGN, 1986, 7 (09): : 96 - &
[7] Software review for automatic test equipment
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[J]. AUTOTESTCON 2005, 2005, : 30 - 35
[8] Cyber Security for Automatic Test Equipment
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[J]. IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2018, 21 (04) : 4 - 8
[9] CFD analysis of automatic test equipment
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[J]. ITHERM 2004, VOL 1, 2004, : 722 - 725
[10] Cyber security for Automatic Test Equipment
Young, Neal
[J]. 2017 IEEE AUTOTESTCON, 2017, : 80 - 83