Thickness control and defects in oriented mesoporous silica films

被引:67
|
作者
Yang, H [1 ]
Coombs, N [1 ]
Ozin, GA [1 ]
机构
[1] Univ Toronto, Lash Miller Chem Labs, Mat Chem Res Grp, Toronto, ON M5S 3H6, Canada
关键词
D O I
10.1039/a800004b
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
By using a surfactant-based synthesis strategy, we have earlier demonstrated that the polymerization and growth of silicate micellar assemblies at the air-water interface, under quiescent and dilute acidic aqueous conditions, yields free-standing submicron thickness hexagonal mesoporous silica films in which the channels are oriented parallel to the film surface. TEM imaging studies of these thin films showed that microscopic defects pervade the channel structure with topologies resembling those found in lyotropic liquid crystals. This suggested that the mesoporous silica film evolved from silicification of a surface lyotropic silicate mesophase. Herein it is demonstrated that film growth, defect structure, extent of polymerization, and mesoporosity sensitively depend on the choice of synthesis acidity, temperature and mixing, and in the case of supported films, on the choice of substrate. In particular, a ten-fold increase in the thickness of the film can be obtained by simply lowering the acidity and moving to ambient temperature conditions whilst an alteration in mixing conditions can change the film from a discrete to a continuous morphology. Combined PXRD, TEM and nitrogen adsorption studies show that the silica films are hexagonal, oriented and mesoporous. Furthermore, the observation of a focal conic fan-type texture in the free-standing films shows that defect controlled director fields, that exist in a precursor hexagonal lyotropic silicate mesophase, are preserved in the channel structure of the mesoporous silica phase. Proof-of-existence of liquid crystalline texture in such free-standing mesoporous silica films, provides direct evidence that film growth evolves from the cooperative assembly and organization of silicate micellar species at the air-water interface.
引用
收藏
页码:1205 / 1211
页数:7
相关论文
共 50 条
  • [21] Improving pore exposure in mesoporous silica films for mechanized control of the pores
    Klichko, Yaroslav
    Khashab, Niveen M.
    Yang, Ying-Wei
    Angelos, Sarah
    Stoddart, J. Fraser
    Zink, Jeffrey I.
    MICROPOROUS AND MESOPOROUS MATERIALS, 2010, 132 (03) : 435 - 441
  • [22] Determination of average wall thickness of mesoporous silica
    Li, ZH
    Gong, YJ
    Wu, D
    Sun, YH
    Wang, J
    Liu, Y
    Dong, BZ
    CHINESE CHEMICAL LETTERS, 2001, 12 (08) : 741 - 744
  • [23] Determination of Average Wall Thickness of Mesoporous Silica
    Zhi Hong LI1
    ChineseChemicalLetters, 2001, (08) : 741 - 744
  • [24] Oriented mesoporous organosilicate thin films
    Freer, EM
    Krupp, LE
    Hinsberg, WD
    Rice, PM
    Hedrick, JL
    Cha, JN
    Miller, RD
    Kim, HC
    NANO LETTERS, 2005, 5 (10) : 2014 - 2018
  • [25] Free-standing and oriented mesoporous silica films grown at the air-water interface
    Yang, H
    Coombs, N
    Sokolov, I
    Ozin, GA
    NATURE, 1996, 381 (6583) : 589 - 592
  • [26] Oriented Mesoporous Silica Films Obtained by Electro-Assisted Self-Assembly (EASA)
    Goux, Aurelie
    Etienne, Mathieu
    Aubert, Emmanuel
    Lecomte, Claude
    Ghanbaja, Jaafar
    Walcarius, Alain
    CHEMISTRY OF MATERIALS, 2009, 21 (04) : 731 - 741
  • [27] Amplified Charge Transfer for Anionic Redox Probes through Oriented Mesoporous Silica Thin Films
    Karman, Cheryl
    Vila, Neus
    Walcarius, Alain
    CHEMELECTROCHEM, 2016, 3 (12): : 2130 - 2137
  • [28] Ionothermal Stability of Mesoporous Silica Films
    Prosser, Jacob H.
    Lee, Daeyeon
    INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 2015, 54 (03) : 957 - 967
  • [29] Transferable thin films of mesoporous silica
    Bandyopadhyaya, R
    Nativ-Roth, E
    Yerushalmi-Rozen, R
    Regev, O
    CHEMISTRY OF MATERIALS, 2003, 15 (19) : 3619 - 3624
  • [30] Growth and characterization of mesoporous silica films
    Edler, KJ
    Roser, SJ
    INTERNATIONAL REVIEWS IN PHYSICAL CHEMISTRY, 2001, 20 (03) : 387 - 466