Exclusive test and its applications to fault diagnosis

被引：35

作者：

Agrawal, VD ^{[1
]}

Baik, DH ^{[1
]}

Kim, YC ^{[1
]}

Saluja, KK ^{[1
]}

机构：

[1] Rutgers State Univ, Dept ECE, Piscataway, NJ 08855 USA

来源：

16TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS | 2003年

关键词：

D O I：

10.1109/ICVD.2003.1183128

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

We introduce a new type of test, called exclusive test, and discuss its application to fault diagnosis in combinational circuits. A test that detects exactly one fault from a given pair of faults is called an exclusive test. In general, generation of an exclusive test by a conventional automatic test generator requires a model of the circuit with multiple-faults. We describe an ATPG model that transforms the exclusive test problem into a single-fault test generation problem. We present a generalized diagnostic method and illustrate the use of exclusive tests,in improving the diagnostic resolution of a test set. Results of diagnosis with exclusive tests for ISCAS85 benchmark circuits are included.

引用

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页码：143 / 148

页数：6

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