Robust Single-Shot Spin Measurement with 99.5% Fidelity in a Quantum Dot Array

被引：50

作者：

Nakajima, Takashi ^{[1
]}

Delbecq, Matthieu R. ^{[1
]}

Otsuka, Tomohiro ^{[1
,2
]}

Stano, Peter ^{[1
,6
]}

Amaha, Shinichi ^{[1
]}

Yoneda, Jun ^{[1
]}

Noiri, Akito ^{[3
]}

Kawasaki, Kento ^{[3
]}

Takeda, Kenta ^{[1
]}

Allison, Giles ^{[1
]}

Ludwig, Arne ^{[4
]}

Wieck, Andreas D. ^{[4
]}

Loss, Daniel ^{[1
,5
]}

Tarucha, Seigo ^{[1
,3
]}

机构：

[1] RIKEN, Ctr Emergent Matter Sci, 2-1 Hirosawa, Wako, Saitama 3510198, Japan

[2] JST, PRESTO, 4-1-8 Honcho, Kawaguchi, Saitama 3320012, Japan

[3] Univ Tokyo, Dept Appl Phys, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1138656, Japan

[4] Ruhr Univ Bochum, Lehrstuhl Angew Festkorperphys, D-44780 Bochum, Germany

[5] Univ Basel, Dept Phys, Klingelbergstr 82, CH-4056 Basel, Switzerland

[6] Slovak Acad Sci, Inst Phys, Bratislava 84511, Slovakia

来源：

PHYSICAL REVIEW LETTERS | 2017年 / 119卷 / 01期

关键词：

ELECTRON-SPIN; QUBIT; COMPUTATION; RESONANCE;

D O I：

10.1103/PhysRevLett.119.017701

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We demonstrate a new method for projective single-shot measurement of two electron spin states (singlet versus triplet) in an array of gate-defined lateral quantum dots in GaAs. The measurement has very high fidelity and is robust with respect to electric and magnetic fluctuations in the environment. It exploits a long-lived metastable charge state, which increases both the contrast and the duration of the charge signal distinguishing the two measurement outcomes. This method allows us to evaluate the charge measurement error and the spin-to-charge conversion error separately. We specify conditions under which this method can be used, and project its general applicability to scalable quantum dot arrays in GaAs or silicon.

引用

页数：6

共 50 条

[41] Single-shot readout of an electron spin in silicon
Andrea Morello
Jarryd J. Pla
Floris A. Zwanenburg
Kok W. Chan
Kuan Y. Tan
Hans Huebl
Mikko Möttönen
Christopher D. Nugroho
Changyi Yang
Jessica A. van Donkelaar
Andrew D. C. Alves
David N. Jamieson
Christopher C. Escott
Lloyd C. L. Hollenberg
Robert G. Clark
Andrew S. Dzurak
Nature, 2010, 467 : 687 - 691
[42] Deterministic and Robust Generation of Single Photons from a Single Quantum Dot with 99.5% Indistinguishability Using Adiabatic Rapid Passage
Wei, Yu-Jia
He, Yu-Ming
Chen, Ming-Cheng
Hu, Yi-Nan
He, Yu
Wu, Dian
Schneider, Christian
Kamp, Martin
Hoefling, Sven
Lu, Chao-Yang
Pan, Jian-Wei
NANO LETTERS, 2014, 14 (11) : 6515 - 6519
[43] Scalable simultaneous multiqubit readout with 99.99% single-shot fidelity
Burrell, A. H.
Szwer, D. J.
Webster, S. C.
Lucas, D. M.
PHYSICAL REVIEW A, 2010, 81 (04):
[44] Fast high fidelity hole spin initialization in a single InGaAs quantum dot
Godden, T. M.
Boyle, S. J.
Ramsay, A. J.
Fox, A. M.
Skolnick, M. S.
2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2011,
[45] Fast high fidelity hole spin initialization in a single InGaAs quantum dot
Godden, T. M.
Boyle, S. J.
Ramsay, A. J.
Fox, A. M.
Skolnick, M. S.
APPLIED PHYSICS LETTERS, 2010, 97 (06)
[46] Benchmarking high fidelity single-shot readout of semiconductor qubits
Keith, D.
Gorman, S. K.
Kranz, L.
He, Y.
Keizer, J. G.
Broome, M. A.
Simmons, M. Y.
NEW JOURNAL OF PHYSICS, 2019, 21 (06):
[47] A single-shot measurement of the energy of product states in a translation invariant spin chain can replace any quantum computation
Janzing, Dominik
Wocjan, Pawel
Zhang, Shengyu
NEW JOURNAL OF PHYSICS, 2008, 10
[48] Influences of quantum fluctuation on superfluorescent spectra observed by single-shot measurement for semiconductor quantum dots
Nasu, Masaki
Kawamura, Kohei
Yoshida, Tomoharu
Ishihara, Jun
Miyajima, Kensuke
APPLIED PHYSICS EXPRESS, 2020, 13 (06)
[49] Single-shot measurement of a terahertz pulse (N)
Applied Optics, 1998, 37 (34):
[50] Optimal Single-Shot Decoding of Quantum Codes
Cumitini, Aldo
Tinelli, Stefano
Matuz, Balazs
Lazaro, Francisco
Barletta, Luca
IEEE COMMUNICATIONS LETTERS, 2024, 28 (06) : 1243 - 1247

← 1 2 3 4 5 →