Dephasing in semiconductor-superconductor structures by coupling to a voltage probe

被引:14
|
作者
Mortensen, NA
Jauho, AP
Flensberg, K
机构
[1] Tech Univ Denmark, Mikroelektron Ctr, DK-2800 Lyngby, Denmark
[2] Univ Copenhagen, Niels Bohr Inst, Orsted Lab, DK-2100 Copenhagen O, Denmark
关键词
Andreev scattering; quantum interference; dephasing;
D O I
10.1006/spmi.2000.0890
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of Two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account. (C) 2000 Academic Press.
引用
收藏
页码:67 / 76
页数:10
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