Toward superfast three-dimensional optical metrology with digital micromirror device platforms

被引:23
|
作者
Bell, Tyler [1 ]
Zhang, Song [1 ]
机构
[1] Iowa State Univ, Dept Mech Engn, Ames, IA 50011 USA
基金
美国国家科学基金会;
关键词
superfast three-dimensional optical metrology; binary defocusing; phase shifting; fringe analysis; structured light; PULSE-WIDTH MODULATION; OPTIMIZED DITHERING TECHNIQUE; 3D SHAPE MEASUREMENT; HIGH-RESOLUTION; BINARY; CALIBRATION;
D O I
10.1117/1.OE.53.11.112206
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Decade-long research efforts toward superfast three-dimensional (3-D) shape measurement leveraging the digital micromirror device (DMD) platforms are summarized. Specifically, we will present the following technologies: (1) high-resolution real-time 3-D shape measurement technology that achieves 30 Hz simultaneous 3-D shape acquisition, reconstruction, and display with more than 300,000 points per frame; (2) superfast 3-D optical metrology technology that achieves 3-D measurement at a rate of tens of kilohertz utilizing the binary defocusing method we invented; and (3) the improvement of the binary defocusing technology for superfast and high-accuracy 3-D optical metrology using the DMD platforms. Both principles and experimental results are presented. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:9
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