Design of experiments and statistical process control using wavelets analysis

被引：22

作者：

Cohen, Achraf ^{[1
]}

Tiplica, Teodor ^{[1
]}

Kobi, Abdessamad ^{[1
]}

机构：

[1] LUNAM, ISTIA Engn Sch, LARIS Syst Engn Res Lab, 62 Ave Notre Dame du Lac, F-49000 Angers, France

来源：

CONTROL ENGINEERING PRACTICE | 2016年 / 49卷

关键词：

Fault detection; Control charts; Design of experiments; Likelihood ratio; Wavelets transformations; Change time; Multiscale SPC; PRINCIPAL-COMPONENT ANALYSIS; FAULT-DETECTION; MULTIRESOLUTION ANALYSIS; ECONOMIC DESIGN; CLASSIFICATION; TRANSFORM; CORROSION;

D O I：

10.1016/j.conengprac.2015.07.013

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, three new connections between Wavelets analysis and Statistical Quality Control are proposed. Firstly, we show that the Discrete Wavelet Transform, using Haar wavelet, is equivalent to the Xbar-R control scheme. Results concerning the distribution of wavelets coefficients, using others wavelets families, are presented, and then a new control chart, called DeWave, is proposed, in order to monitor the variability of the process. Secondly, the equivalence between the Likelihood Ratio and the Continuous Wavelet Transform, in terms of estimating the change time, is presented. Finally, we demonstrate that the Discrete Wavelet Transform is an equivalent representation of factorial Design Of Experiments. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：129 / 138

页数：10

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