Copper Materials for Low Temperature Sintering

被引:15
|
作者
Nishimoto, Masamu [1 ]
Tokura, Rintaro [1 ]
Mai Thanh Nguyen [1 ]
Yonezawa, Tetsu [1 ]
机构
[1] Hokkaido Univ, Fac Engn, Div Mat Sci & Engn, Sapporo, Hokkaido 0608628, Japan
基金
日本科学技术振兴机构;
关键词
copper; particles; sintering; low temperature; printed electronics; conductive; FINE PARTICLES; PRINTED ELECTRONICS; GOLD NANOPARTICLES; INK; NANOMATERIALS; CONDUCTIVITY; FABRICATION; CHEMISTRY; POLYMER; FILMS;
D O I
10.2320/matertrans.MT-N2021004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this review paper, recent studies on low-temperature sintering strategies of copper materials for conductive layer preparation have been summarized. Coinage metals, gold, silver, and copper have been used as materials for conductive inks and pastes for printed electronics. Copper is a highly electrically and thermally conductive material that can be used in electronic circuits and die-attach materials. Recently, copper-based inks/pastes have gained significant attention of researchers and industries as conductive materials. However, copper is readily oxidized under air, especially, at the nanoscale, and copper particles may catch fire because of the rapid oxidization. To overcome this issue, copper nanoparticles and fine particles are coated with organic molecules which act as insulators after sintering. Some interesting surface treatments or activation strategies have been investigated in this regard. In this paper, different perspectives on the applications of copper in conductive and die-attach materials have been presented.
引用
收藏
页码:663 / 675
页数:13
相关论文
共 50 条
  • [21] Low temperature sintering of copper biporous wicks with improved maximum capillary pressure
    Choi, Jeehoon
    Yuan, Yuan
    Sano, Wataru
    Borca-Tasciuc, Diana-Andra
    MATERIALS LETTERS, 2014, 132 : 349 - 352
  • [22] Cool-SPS: an opportunity for low temperature sintering of thermodynamically fragile materials
    de Beauvoir, Thomas Herisson
    Sangregorio, Anna
    Cornu, Inaki
    Elissalde, Catherine
    Josse, Michael
    JOURNAL OF MATERIALS CHEMISTRY C, 2018, 6 (09) : 2229 - 2233
  • [23] Low Temperature Sintering of Ferro-materials with Both Capacitance and Inductance Properties
    Qi, Xiwei
    Han, Weiqi
    Wang-yang, Peihua
    Wang, Haifeng
    HIGH-PERFORMANCE CERAMICS VI, 2010, 434-435 : 357 - +
  • [24] Advanced Interconnect Materials for Ink-jet Printing by Low Temperature Sintering
    Zhang, Rongwei
    Wong, C. P.
    2009 IEEE 59TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, VOLS 1-4, 2009, : 150 - 154
  • [25] Influence of sintering temperature on properties of low alloyed high strength pm materials
    Engström, U
    Senad, D
    POWDER METALLURGY IN AUTOMOTIVE APPLICATIONS-II, 2002, : 177 - 186
  • [26] Low Temperature Sintering of PZT
    Medesi, A.
    Greiner, T.
    Benkler, M.
    Megnin, C.
    Hanemann, T.
    14TH INTERNATIONAL CONFERENCE ON MICRO AND NANOTECHNOLOGY FOR POWER GENERATION AND ENERGY CONVERSION APPLICATIONS (POWERMEMS 2014), 2014, 557
  • [27] Expeditious low-temperature sintering of copper nanoparticles with thin defective carbon shells
    Kim, Changkyu
    Lee, Gyoungja
    Rhee, Changkyu
    Lee, Minku
    NANOSCALE, 2015, 7 (15) : 6627 - 6635
  • [28] 3D Interconnect technology based on low temperature copper nanoparticle sintering
    Zhang, B.
    Carisey, Y. C. P.
    Damian, A.
    Poelma, R. H.
    Zhang, G. Q.
    van Zeijl, H. W.
    2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 1163 - 1167
  • [29] Mechanical Study of Copper Bonded at Low Temperature using Spark Plasma Sintering Process
    Mouawad, Bassem
    Soueidan, Maher
    Fabregue, Damien
    Buttay, Cyril
    Bley, Vincent
    Allard, Bruno
    ADVANCES IN INNOVATIVE MATERIALS AND APPLICATIONS, 2011, 324 : 177 - +
  • [30] All-Copper Flip Chip Interconnects by Pressureless and Low Temperature Nanoparticle Sintering
    Zurcher, Jonas
    Del Carro, Luca
    Schlottig, Gerd
    Brunschwiler, Thomas
    Wright, Daniel Nilsen
    Vardoy, Astrid-Sofie B.
    Taklo, Maaike M. Visser
    Mills, Tobias
    Zschenderlein, Uwe
    Wunderle, Bernhard
    2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 343 - 349