Bidirectional reflectance distribution function measurements and analysis of retroreflective materials

被引：14
|
作者：
Belcour, Laurent [1 ,2 ]
Pacanowski, Romain [3 ]
Delahaie, Marion [4 ]
Laville-Geay, Aude [4 ]
Eupherte, Laure [4 ]
机构：
[1] Inria Bordeaux Sud Ouest, F-33405 Talence, France
[2] Univ Montreal, Montreal, PQ, Canada
[3] CNRS, F-33402 Talence, France
[4] CEA, F-33116 Le Barp, France
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2014年 / 31卷 / 12期
关键词：
2ND-ORDER SHADOWING FUNCTION; ROUGH DIELECTRIC SURFACES; HIGH-FREQUENCY LIMIT; RETRO-REFLECTION; MULTIPLE-SCATTERING; GLASS-BEADS; BRDF; BACKSCATTERING;
D O I：
10.1364/JOSAA.31.002561
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We compare the performance of various analytical retroreflecting bidirectional reflectance distribution function (BRDF) models to assess how they reproduce accurately measured data of retroreflecting materials. We introduce a new parametrization, the back vector parametrization, to analyze retroreflecting data, and we show that this parametrization better preserves the isotropy of data. Furthermore, we update existing BRDF models to improve the representation of retroreflective data. (C) 2014 Optical Society of America
引用
收藏
页码：2561 / 2572
页数：12
相关论文
共 50 条
  • [31] Measurement System of Bidirectional Reflectance-distribution Function
    Hwang, Jisoo
    KOREAN JOURNAL OF OPTICS AND PHOTONICS, 2010, 21 (02) : 46 - 52
  • [32] RAYLEIGH-SCATTERING LIMITS FOR LOW-LEVEL BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION MEASUREMENTS
    ASMAIL, C
    HSIA, J
    PARR, A
    HOEFT, J
    APPLIED OPTICS, 1994, 33 (25): : 6084 - 6091
  • [33] Bidirectional Reflectance Distribution Function of Rough Silicon Wafers
    Y. J. Shen
    Z. M. Zhang
    B. K. Tsai
    D. P. DeWitt
    International Journal of Thermophysics, 2001, 22 : 1311 - 1326
  • [34] Influence of finite-sized detection solid angle on bidirectional reflectance distribution function measurements
    Johansson, Niklas
    Neuman, Magnus
    Andersson, Mattias
    Edstrom, Per
    APPLIED OPTICS, 2014, 53 (06) : 1212 - 1220
  • [35] Bidirectional reflectance distribution function of diffuse extreme ultraviolet scatterers and extreme ultraviolet baffle materials
    Newell, MP
    KeskiKuha, RAM
    APPLIED OPTICS, 1997, 36 (22): : 5471 - 5475
  • [36] Bidirectional reflectance distribution function of diffuse extreme ultraviolet scatterers and extreme ultraviolet baffle materials
    Newell, Michael P.
    Keski-Kuha, Ritva A. M.
    Applied Optics, 1997, 36 (22): : 5471 - 5475
  • [37] Bidirectional Reflectance Distribution Function (BRDF) Measurement of Materials Aged Under Simulated Space Environment
    Jainisha Shah
    Gregory Badura
    Ryan Hoffmann
    Daniel Engelhart
    The Journal of the Astronautical Sciences, 71
  • [38] Statistical Analysis of Bidirectional Reflectance Distribution Functions
    Zubiaga, Carlos J.
    Belcour, Laurent
    Bosch, Caries
    Munoz, Adolfo
    Barla, Pascal
    MEASURING, MODELING, AND REPRODUCING MATERIAL APPEARANCE 2015, 2015, 9398
  • [39] Bidirectional Reflectance Distribution Function (BRDF) Measurement of Materials Aged Under Simulated Space Environment
    Shah, Jainisha
    Badura, Gregory
    Hoffmann, Ryan
    Engelhart, Daniel
    JOURNAL OF THE ASTRONAUTICAL SCIENCES, 2024, 71 (01):
  • [40] Spectral and geometrical variation of the bidirectional reflectance distribution function of diffuse reflectance standards
    Ferrero, Alejandro
    Maria Rabal, Ana
    Campos, Joaquin
    Pons, Alicia
    Luisa Hernanz, Maria
    APPLIED OPTICS, 2012, 51 (36) : 8535 - 8540
12345