Improvement in High-temperature Dielectric Properties of Epoxy Resin by Abundant Addition of Micro-silica

被引:0
|
作者
Hyuga, Mayumi [1 ]
Tagami, Naoki [1 ]
Tanaka, Toshikatsu [2 ]
Ohki, Yoshimichi [1 ]
Imai, Takahiro [3 ]
Harada, Miyuki [4 ]
Ochi, Mitsukazu [4 ]
机构
[1] Waseda Univ, Dept EEBS, Shinjuku Ku, Tokyo 1698555, Japan
[2] Waseda Univ, IPS Res Ctr, Kitakyushu, Fukuoka 8080135, Japan
[3] Toshiba Co Ltd, Power & Ind Syst R&D Ctr, Fuchu, Tokyo 1838511, Japan
[4] Kansai Univ, Dept Appl Chem, Suita, Osaka 5648680, Japan
来源
CEIDP: 2009 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA | 2009年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Effects of addition of micro-sized silica fillers and/or nano-sized clay fillers into epoxy resin on its dielectric properties were examined. The glass transition intermediate temperature (T-g) was found to show a decrease by the addition of a small amount of nanofillers, while it is increased by the addition of abundant microfillers with and without co-addition of a small amount of nanofillers. At temperatures above T-g, the samples with abundant microfillers were added have low conductivity, low dielectric constant, and low dielectric loss factor regardless of the co-addition of nanofillers.
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页码:237 / +
页数:2
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