A technique for identifying RTL and gate-level correspondences

被引:3
|
作者
Ravi, S [1 ]
Ghosh, I [1 ]
Boppana, V [1 ]
Jha, NK [1 ]
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
关键词
D O I
10.1109/ICCD.2000.878351
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we consider the mapping problem of identifying correspondences between a signal in a high-level specification and a net in a lower-level implementation for a given design. Conventional techniques use shared names to associate a signal with a net whenever possible. However, given that a synthesis flow may not preserve names, solutions to the above problem eventually take recourse to expensive alternatives such as formal verification. This work provides a robust framework for identifying RTL signal to gate-lever net correspondences for a given design. Our technique exploits the observation that circuit diagnosis provides a convenient means for locating faults in a gate-level network. Since our problem requires locating gate-level nets corresponding to RTL signals, we formulate the mapping problem as a query whose solution is provided by a circuit diagnosis engine. Our experimental work with industrial designs for many mapping cases shows that our solution to the mapping problem is (i) fast, and (ii) precise in identifying the gate-level equivalents (the number of nets returned by our mapping engine for a query is typically 1 or 2 even for designs with tens of thousands of VHDL lines).
引用
收藏
页码:591 / 594
页数:4
相关论文
共 50 条
  • [1] Fault-diagnosis-based technique for establishing RTL and gate-level correspondences
    Ravi, S
    Ghosh, I
    Boppana, V
    Jha, NK
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2001, 20 (12) : 1414 - 1425
  • [2] RTL power optimization with gate-level accuracy
    Wang, Q
    Roy, S
    [J]. ICCAD-2003: IEEE/ACM DIGEST OF TECHNICAL PAPERS, 2003, : 39 - 45
  • [3] Fast test generation for circuits with RTL and gate-level views
    Ravi, S
    Jha, NK
    [J]. INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, : 1068 - 1077
  • [4] Automatically adjusting system level designs after RTL/gate-level ECO
    Wang, Qinhao
    Kimura, Yusuke
    Fujita, Masahiro
    [J]. 2016 IEEE INTERNATIONAL HIGH LEVEL DESIGN VALIDATION AND TEST WORKSHOP (HLDVT), 2016, : 108 - 112
  • [5] Spectral RTL test generation for gate-level stuck-at faults
    Yogi, Nitin
    Agrawal, Vishwani D.
    [J]. PROCEEDINGS OF THE 15TH ASIAN TEST SYMPOSIUM, 2006, : 83 - +
  • [6] Representing Gate-Level SET Faults by Multiple SEU Faults at RTL
    Bagbaba, Ahmet Cagri
    Jenihhin, Maksim
    Ubar, Raimund
    Sauer, Christian
    [J]. 2020 26TH IEEE INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2020), 2020,
  • [7] GATE-LEVEL SIMULATION
    DABREU, MA
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (06): : 63 - 71
  • [8] An approximated soft error analysis technique for gate-level designs
    Kwon, Soongyu
    Park, Jong Kang
    Kim, Jong Tae
    [J]. IEICE ELECTRONICS EXPRESS, 2014, 11 (10):
  • [9] A soft error mitigation technique for constrained gate-level designs
    Park, Jong Kang
    Kim, Jong Tae
    [J]. IEICE ELECTRONICS EXPRESS, 2008, 5 (18) : 698 - 704
  • [10] The Improved COTD Technique for Hardware Trojan Detection in Gate-level Netlist
    Salmani, Hassan
    [J]. PROCEEDINGS OF THE 32ND GREAT LAKES SYMPOSIUM ON VLSI 2022, GLSVLSI 2022, 2022, : 449 - 454