Effect of Plastic Deformation on the Proof Strength and Electrical Conductivity of Copper-Magnesium Supersaturated Solid-Solution Alloys

被引:14
|
作者
Ito, Yuki [1 ]
Matsunaga, Hirotaka [1 ]
Mori, Hiroyuki [1 ]
Maki, Kazunari [1 ]
机构
[1] Mitsubishi Mat Corp, Cent Res Inst, Kitamoto 3640022, Japan
关键词
copper alloys; electrical resistivity/conductivity; proof strength; supersaturated solid solution alloys; CU-AL ALLOYS; MECHANICAL-PROPERTIES; ENERGY;
D O I
10.2320/matertrans.M2014220
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The influences of plastic deformation on the proof strength and electrical conductivity of Copper-Magnesium (Cu-Mg) supersaturated solid-solution alloys are investigated and compared to results obtained for pure copper and conventional binary solid-solution copper alloys. Supersaturated Cu-Mg required cold rolling to only a quarter of the equivalent strain (epsilon = 0.65) of conventional alloys (epsilon = 2.66) to obtain the same proof strength and electrical conductivity. Furthermore, when cold-rolled to epsilon = 2.66, Cu-Mg exhibited an electrical conductivity 2.5 times higher than that of conventional alloys, while retaining comparable proof strength.
引用
收藏
页码:1738 / 1741
页数:4
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